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Jointly Learning Multiple Curvature Descriptor for 3D Palmprint Recognition
Fei, L.1; Qin, J.1; Liu, P.1; Wen, J.2; Tian, C.2; Zhang, B.3; Zhao, S.3
2021-05-01
Conference Name25th International Conference on Pattern Recognition, ICPR 2020
Source PublicationProceedings - International Conference on Pattern Recognition
Pages302 - 308
Conference Date10-15 January 2021
Conference PlaceMilan, Italy
CountryItaly
Publication PlaceIEEE COMPUTER SOC, 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA
PublisherIEEE
Abstract

3D palmprint-based biometric recognition has drawn growing research attention due to its several merits over 2D counterpart such as robust structural measurement of a palm surface and high anti-counterfeiting capability. However, most existing 3D palmprint descriptors are hand-crafted that usually extract stationary features from 3D palmprint images. In this paper, we propose a feature learning method to jointly learn compact curvature feature descriptor for 3D palmprint recognition. We first form multiple curvature data vectors to completely sample the intrinsic curvature information of 3D palmprint images. Then, we jointly learn a feature projection function that project curvature data vectors into binary feature codes, which have the maximum inter-class variances and minimum intra-class distance so that they are discriminative. Moreover, we learn the collaborative binary representation of the multiple curvature feature codes by minimizing the information loss between the final representation and the multiple curvature features, so that the proposed method is more compact in feature representation and efficient in matching. Experimental results on the baseline 3D palmprint database demonstrate the superiority of the proposed method in terms of recognition performance in comparison with state-of-the-art 3D palmprint descriptors.

Keyword3d Palmprint Recognition
DOI10.1109/ICPR48806.2021.9413188
URLView the original
Indexed ByCPCI-S
Language英語English
WOS Research AreaComputer Science ; Engineering ; Imaging Science & Photographic Technology
WOS SubjectComputer Science, Artificial Intelligence ; Engineering, Electrical & Electronic ; Imaging Science & Photographic Technology
WOS IDWOS:000678409200041
The Source to ArticlePB_Publication
Scopus ID2-s2.0-85110477069
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Citation statistics
Document TypeConference paper
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Affiliation1.School of Computer Science and Technology, Guangdong University of Technology, Guangzhou, 510006, China
2.The Bio-Computing Research Center, Harbin Institute of Technology(Shenzhen), Shenzhen, 518055, China
3.Department of Computer and Information Science, University of Macau, Taipa, Macau, 999078, China
Recommended Citation
GB/T 7714
Fei, L.,Qin, J.,Liu, P.,et al. Jointly Learning Multiple Curvature Descriptor for 3D Palmprint Recognition[C], IEEE COMPUTER SOC, 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA:IEEE, 2021, 302 - 308.
APA Fei, L.., Qin, J.., Liu, P.., Wen, J.., Tian, C.., Zhang, B.., & Zhao, S. (2021). Jointly Learning Multiple Curvature Descriptor for 3D Palmprint Recognition. Proceedings - International Conference on Pattern Recognition, 302 - 308.
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