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A 0.024 mm2 4.9 fJ 10-bit 2 MS/s SAR ADC in 65 nm CMOS
Guohe Yin1,2; He-Gong Wei2; U–Fat Chio2; Sai-Weng Sin2; Seng-Pan U2; Zhihua Wang1; Rui Paulo Martins2,3
2012-12-14
Conference NameEuropean Solid-State Circuits Conference
Source Publication2012 Proceedings of the ESSCIRC (ESSCIRC)
Pages377-380
Conference Date17-21 Sept. 2012
Conference PlaceBordeaux, France
Abstract

This paper presents a Successive Approximation Register Analog-to-Digital Converter (SAR ADC) design for sensor applications. An energy-saving switching technique is proposed to achieve ultra low power consumption. The measured Signal-to-Noise-and-Distortion Ratio (SNDR) of the ADC is 58.4 dB at 2 MS/s with an ultra-low power consumption of only 6.6 μW from a 0.8V supply, resulting in a Figure-Of-Merit (FOM) of 4.9 fJ/conversion-step. The prototype is fabricated in 65 nm CMOS technology with an area of 0.024 mm. © 2012 IEEE.

KeywordAnalgo-to-digital Converter Successive Approximation Register Ultra-low Power Sensor Applications
DOI10.1109/ESSCIRC.2012.6341364
URLView the original
Indexed By其他
Language英語English
Scopus ID2-s2.0-84870836849
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Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Faculty of Science and Technology
INSTITUTE OF MICROELECTRONICS
Affiliation1.Institute of Microelectronics, Tsinghua University, Beijing, China
2.State-Key Laboratory of Analog and Mixed Signal VLSI, Faculty of Science and Technology, University of Macau, Macao, China
3.On leave from Instituto Superior Técnico/TU of Lisbon, Portugal
First Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Guohe Yin,He-Gong Wei,U–Fat Chio,et al. A 0.024 mm2 4.9 fJ 10-bit 2 MS/s SAR ADC in 65 nm CMOS[C], 2012, 377-380.
APA Guohe Yin., He-Gong Wei., U–Fat Chio., Sai-Weng Sin., Seng-Pan U., Zhihua Wang., & Rui Paulo Martins (2012). A 0.024 mm2 4.9 fJ 10-bit 2 MS/s SAR ADC in 65 nm CMOS. 2012 Proceedings of the ESSCIRC (ESSCIRC), 377-380.
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