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A 0.05- mm2 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS
Tan, Fei1; Yu, Wei-Han1; Un, Ka-Fai1; Martins, Rui1,2; Mak, Pui-In1
2023-07
Source PublicationIEEE JOURNAL OF SOLID-STATE CIRCUITS
ISSN0018-9200
Abstract

This article reports a keyword-spotting (KWS) chip for voice-controlled devices. It features a number of techniques to enhance the performance, area, and power efficiencies: 1) a fast-sampling convolutional neural network (FS-CNN) that eliminates the power-hungry feature extractors and reduces the decision latency; 2) an always-retention 5T-SRAM that features word-voltage switches to reduce the leakage power and single bitline (BL) operation to halve the SRAM read power compared to the typical 6T-SRAM; and 3) a high-resolution sparsity-aware computing (HR-SAC) unit that enhances the precision and output swing of the multiply–accumulate (MAC) computation. Benchmarking with the state-of-the-art, our KWS chip prototyped in 28-nm CMOS scores a > 90% accuracy for the 11-class Google speech command dataset (GSCD) at 2.91 μ W, which corresponds to a 2.91-nJ energy/decision. The achieved latency is 2 ms/decision, and the core area is 0.05 mm2 , including the full KWS model.

URLView the original
Indexed BySCIE
Language英語English
Document TypeJournal article
CollectionUniversity of Macau
Corresponding AuthorYu, Wei-Han
Affiliation1.University of Macau
2.Instituto Superior Tecnico
Recommended Citation
GB/T 7714
Tan, Fei,Yu, Wei-Han,Un, Ka-Fai,et al. A 0.05- mm2 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2023.
APA Tan, Fei., Yu, Wei-Han., Un, Ka-Fai., Martins, Rui., & Mak, Pui-In (2023). A 0.05- mm2 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS. IEEE JOURNAL OF SOLID-STATE CIRCUITS.
MLA Tan, Fei,et al."A 0.05- mm2 2.91-nJ/Decision Keyword-Spotting (KWS) Chip Featuring an Always-Retention 5T-SRAM in 28-nm CMOS".IEEE JOURNAL OF SOLID-STATE CIRCUITS (2023).
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