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In Situ and Operando Characterization Techniques in Stability Study of Perovskite-Based Devices
He,Bingchen1; Wang,Chenyue2; Li,Jielei1; Su,Zhenhuang2; Xing,Guichuan1; Gao,Xingyu2; Chen,Shi1
Source PublicationNanomaterials
ISSN2079-4991
2023-07-01
Abstract

Metal halide perovskite materials have demonstrated significant potential in various optoelectronic applications, such as photovoltaics, light emitting diodes, photodetectors, and lasers. However, the stability issues of perovskite materials continue to impede their widespread use. Many studies have attempted to understand the complex degradation mechanism and dynamics of these materials. Among them, in situ and/or operando approaches have provided remarkable insights into the degradation process by enabling precise control of degradation parameters and real-time monitoring. In this review, we focus on these studies utilizing in situ and operando approaches and demonstrate how these techniques have contributed to reveal degradation details, including structural, compositional, morphological, and other changes. We explore why these two approaches are necessary in the study of perovskite degradation and how they can be achieved by upgrading the corresponding ex situ techniques. With recent stability improvements of halide perovskite using various methods (compositional engineering, surface engineering, and structural engineering), the degradation of halide perovskite materials is greatly retarded. However, these improvements may turn into new challenges during the investigation into the retarded degradation process. Therefore, we also highlight the importance of enhancing the sensitivity and probing range of current in situ and operando approaches to address this issue. Finally, we identify the challenges and future directions of in situ and operando approaches in the stability research of halide perovskites. We believe that the advancement of in situ and operando techniques will be crucial in supporting the journey toward enhanced perovskite stability.

KeywordDegradation In Situ/operando Perovskite Materials
Language英語English
DOI10.3390/nano13131983
URLView the original
Volume13
Issue13
Pages1983
WOS IDWOS:001033235800001
WOS SubjectChemistry, Multidisciplinary ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS Research AreaChemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
Indexed BySCIE
Scopus ID2-s2.0-85164723454
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Document TypeReview article
CollectionINSTITUTE OF APPLIED PHYSICS AND MATERIALS ENGINEERING
Corresponding AuthorSu,Zhenhuang; Gao,Xingyu; Chen,Shi
Affiliation1.Joint Key Laboratory of the Ministry of Education,Institute of Applied Physics and Materials Engineering,University of Macau,Avenida da Universidade, Taipa,999078,Macao
2.Shanghai Synchrotron Radiation Facility (SSRF),Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai,201204,China
First Author AffilicationINSTITUTE OF APPLIED PHYSICS AND MATERIALS ENGINEERING
Corresponding Author AffilicationINSTITUTE OF APPLIED PHYSICS AND MATERIALS ENGINEERING
Recommended Citation
GB/T 7714
He,Bingchen,Wang,Chenyue,Li,Jielei,et al. In Situ and Operando Characterization Techniques in Stability Study of Perovskite-Based Devices[J]. Nanomaterials, 2023, 13(13), 1983.
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