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Whose Fault Is It? Negative Consumer Experience With AI-enabled Technology
Ho, Kin-yan1; Ho, Ying2; Mac, Vai Iun2; Xiao, Sarah3
2023-06
Publisher45th ISMS Marketing Science Conference
Conference Name45th ISMS Marketing Science Conference
Conference PlaceMiami, USA
Conference DateJune 8-10, 2023
CountryUSA
KeywordAi Word-of-mouth Customer Loyalty
Language英語English
Document TypeConference proceedings
CollectionDEPARTMENT OF MANAGEMENT AND MARKETING
Corresponding AuthorHo, Kin-yan
Affiliation1.The Chinese University of Hong Kong
2.University of Macau
3.Durham University
Recommended Citation
GB/T 7714
Ho, Kin-yan,Ho, Ying,Mac, Vai Iun,et al. Whose Fault Is It? Negative Consumer Experience With AI-enabled Technology[C]:45th ISMS Marketing Science Conference, 2023.
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