Residential College | false |
Status | 已發表Published |
Whose Fault Is It? Negative Consumer Experience With AI-enabled Technology | |
Ho, Kin-yan1; Ho, Ying2; Mac, Vai Iun2; Xiao, Sarah3 | |
2023-06 | |
Publisher | 45th ISMS Marketing Science Conference |
Conference Name | 45th ISMS Marketing Science Conference |
Conference Place | Miami, USA |
Conference Date | June 8-10, 2023 |
Country | USA |
Keyword | Ai Word-of-mouth Customer Loyalty |
Language | 英語English |
Document Type | Conference proceedings |
Collection | DEPARTMENT OF MANAGEMENT AND MARKETING |
Corresponding Author | Ho, Kin-yan |
Affiliation | 1.The Chinese University of Hong Kong 2.University of Macau 3.Durham University |
Recommended Citation GB/T 7714 | Ho, Kin-yan,Ho, Ying,Mac, Vai Iun,et al. Whose Fault Is It? Negative Consumer Experience With AI-enabled Technology[C]:45th ISMS Marketing Science Conference, 2023. |
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