Status已發表Published
A Parametric Diffraction Pattern based Game Module Design for the Experiment of Optical Analogy of Reflected Electron Diffraction from One-Dimensional Structures
Junior, M. G.; Teng, C.; Zheng, J. Z.; Tam, K. W.
2019-12-01
Source PublicationIEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE)
Pages798-802
Publication PlaceYogykarta, Indonesia
PublisherIEEE Press
AbstractIn this paper, an example game module design added to an existing STEM experiment kit of reflected optical diffraction is presented for the illustration of wave/particle properties. Showing fascinating diffraction patterns, the kit demonstrates the different reflected diffraction phenomena of a light beam from laser diode illuminated on the samples with non-uniform grating (or one-dimensional surface modulations). Extracting the parameters of the diffraction patterns generated, namely φ the angle of rotation of the sample and; θ the angle of incidence of the laser beam relative to the surface of the sample; the parametric diffraction pattern based game module design approach is presented with few examples of φ is 30°, 60° as well as 90° and; this approach is anticipated to contribute to the increase of study motivation of the experiment kit used for the teaching of science of diffraction.
KeywordDiffraction Patterns STEM Gamification
Language英語English
The Source to ArticlePB_Publication
PUB ID50682
Document TypeConference paper
CollectionDEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Recommended Citation
GB/T 7714
Junior, M. G.,Teng, C.,Zheng, J. Z.,et al. A Parametric Diffraction Pattern based Game Module Design for the Experiment of Optical Analogy of Reflected Electron Diffraction from One-Dimensional Structures[C], Yogykarta, Indonesia:IEEE Press, 2019, 798-802.
APA Junior, M. G.., Teng, C.., Zheng, J. Z.., & Tam, K. W. (2019). A Parametric Diffraction Pattern based Game Module Design for the Experiment of Optical Analogy of Reflected Electron Diffraction from One-Dimensional Structures. IEEE International Conference on Teaching, Assessment, and Learning for Engineering (TALE), 798-802.
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