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A Digital Readout Integrated Circuit Based on Pixel-Level ADC Incorporating On-Chip Image Algorithm Calibration for IRFPA
Yan Zeng1; Shiheng Yang1; Yueduo Liu1; Rongxin Bao1; Zihao Zhu1; Jiahui Lin1; Xiong Zhou1; Yong Chen2; Jun Yin2; Pui-In Mak2; Qiang Li1
2023-08-04
Source PublicationIEEE Sensors Journal
ISSN1530-437X
Volume23Issue:18Pages:21747-21756
Abstract

This article presents a digital readout integrated circuit (DROIC) with fully ON-chip image algorithm calibration based on the pixel-level 18-bit analog-to-digital converter (ADC) for infrared focal plane array (IRFPA) applications. Such ON-chip calibrations include bad pixel compensation, nonuniformity correction, and background subtraction, which are implemented to avoid ON-chip memory storage for saving power and area. The proposed DROIC was fabricated in a standard 40-nm CMOS process, and it features a 640×512 array size with a 30- μm pixel pitch. The power consumption of a single-pixel ADC is less than 0.7 μW under a supply of 1.1 V. The data rate and the dynamic range are improved and it achieved a noise equivalent differential temperature (NEDT) of 1.8 mK and a peak signal-to-noise ratio (SNR) of 90.1 dB. A test comparison exhibits that the image quality is improved significantly when the calibration is enabled. It is the highest integration level reported DROIC, with fully ON-chip calibration and image-quality enhancement algorithm.

KeywordBackground Subtraction Bad Pixel Compensation Digital Readout Integrated Circuit (Droic) Image Algorithm Infrared Focal Plane Arrays (Irfpas) Nonuniformity Correction Pixel Analog-to-digital Converter (Adc)
DOI10.1109/JSEN.2023.3300874
URLView the original
Language英語English
PublisherInstitute of Electrical and Electronics Engineers Inc.
Scopus ID2-s2.0-85166759201
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Citation statistics
Document TypeJournal article
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Faculty of Science and Technology
THE STATE KEY LABORATORY OF ANALOG AND MIXED-SIGNAL VLSI (UNIVERSITY OF MACAU)
INSTITUTE OF MICROELECTRONICS
Affiliation1.School of Electronic Science and Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China
2.State Key Laboratory of Analog and Mixed-Signal VLSI, Faculty of Science and Technology, Department of ECE, University of Macau, Macau, Macao
Recommended Citation
GB/T 7714
Yan Zeng,Shiheng Yang,Yueduo Liu,et al. A Digital Readout Integrated Circuit Based on Pixel-Level ADC Incorporating On-Chip Image Algorithm Calibration for IRFPA[J]. IEEE Sensors Journal, 2023, 23(18), 21747-21756.
APA Yan Zeng., Shiheng Yang., Yueduo Liu., Rongxin Bao., Zihao Zhu., Jiahui Lin., Xiong Zhou., Yong Chen., Jun Yin., Pui-In Mak., & Qiang Li (2023). A Digital Readout Integrated Circuit Based on Pixel-Level ADC Incorporating On-Chip Image Algorithm Calibration for IRFPA. IEEE Sensors Journal, 23(18), 21747-21756.
MLA Yan Zeng,et al."A Digital Readout Integrated Circuit Based on Pixel-Level ADC Incorporating On-Chip Image Algorithm Calibration for IRFPA".IEEE Sensors Journal 23.18(2023):21747-21756.
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