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Deep Reverse Attack on SIFT Features With a Coarse-to-Fine GAN Model
Li, Xin1; Zhu, Guopu1; Wang, Shen1; Zhou, Yicong2; Zhang, Xinpeng3
2024
Source PublicationIEEE Transactions on Circuits and Systems for Video Technology
ISSN1051-8215
Volume34Issue:7Pages:6391 - 6402
Abstract

Recently, it has been shown that adversaries can reconstruct images from SIFT features through reverse attacks. However, the images reconstructed by existing reverse attack methods suffer from information loss and are unable to sufficiently reveal the private contents of the original images. In this paper, a two-stage deep reverse attack model called Coarse-to-Fine Generative Adversarial Network (CFGAN) is proposed to more deeply explore the information in SIFT features and further demonstrate the risk of privacy leakage associated with SIFT features. Specifically, the proposed model consists of two sub-networks, namely coarse net and fine net. The coarse net is developed to restore coarse images using SIFT features, while the fine net is responsible for refining the coarse images to obtain better reconstruction results. To effectively leverage the information contained in SIFT features, an efficient fusion strategy based on the AdaIN operation is designed in the fine net. Additionally, we introduce a new loss function called sift loss that enhances the color fidelity of reconstructed images. Extensive experiments conducted on various datasets verify that the proposed CFGAN performs favorably against state-of-the-art methods. The reconstructed images exhibit better visual quality, less texture distortion, and higher color fidelity. Source code is available at https://github.com/HITLiXincodes/CFGAN.

KeywordCircuits And Systems Data Privacy Feature Extraction Generative Adversarial Network (Gan) Generative Adversarial Networks Generators Image Color Analysis Image Reconstruction Image Restoration Reverse Attack Scale Invariant Feature Transform (Sift)
DOI10.1109/TCSVT.2024.3367808
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:001263608800016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Scopus ID2-s2.0-85186097957
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionFaculty of Science and Technology
DEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Corresponding AuthorZhu, Guopu
Affiliation1.School of Cyberspace Science, Harbin Institute of Technology, Harbin, China
2.Department of Computer and Information Science, University of Macau, Macau, China
3.School of Computer Science, Fudan University, Shanghai, China
Recommended Citation
GB/T 7714
Li, Xin,Zhu, Guopu,Wang, Shen,et al. Deep Reverse Attack on SIFT Features With a Coarse-to-Fine GAN Model[J]. IEEE Transactions on Circuits and Systems for Video Technology, 2024, 34(7), 6391 - 6402.
APA Li, Xin., Zhu, Guopu., Wang, Shen., Zhou, Yicong., & Zhang, Xinpeng (2024). Deep Reverse Attack on SIFT Features With a Coarse-to-Fine GAN Model. IEEE Transactions on Circuits and Systems for Video Technology, 34(7), 6391 - 6402.
MLA Li, Xin,et al."Deep Reverse Attack on SIFT Features With a Coarse-to-Fine GAN Model".IEEE Transactions on Circuits and Systems for Video Technology 34.7(2024):6391 - 6402.
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