It is well known that different threshold voltage (V) extraction methods exhibit inconsistencies with respect to different drain voltage (V). This inconsistency becomes disruptive when temperature is considered for cryogenic applications such as quantum computing. This investigation examines various V extraction methods from room down to cryogenic temperatures, with a particular emphasis on how different V values combined with extraction methods behave as temperature decreases. For the first time, we find that the square root I method maintains consistency regardless of V, from 300 K all the way down to 10 K is identified. This provides a good insight into how the Drain-Induced Barrier Lowering (DIBL) effect changes with temperature, and positions the square root I method as a reliable tool for V extraction in cryogenic temperature.