UM  > Faculty of Science and Technology  > DEPARTMENT OF ELECTROMECHANICAL ENGINEERING
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The effect of metal noise factor to RFID location system
Wong S.F.; Zheng Y.
2014
Conference Name2013 IEEE International Conference on Industrial Engineering and Engineering Management
Source PublicationIEEE International Conference on Industrial Engineering and Engineering Management
Pages310-314
Conference Date10-13 Dec. 2013
Conference PlaceBangkok, Thailand
Abstract

The technology of Radio Frequency Identification is becoming widely used in industry engineering. However, the UHF RFID tag can be easily affected by environmental noise factors, especially on the metal surface. The metal effect to Radio Frequency Identification (RFID) location system is described in this paper. Different methods are adopted to analyze the circumstances when RFID location system is placing near the metal objects. Simulation for tag antenna is accomplished to detect how the metal plate affecting the magnetic field around the tag. Moreover, the experiments are completed by using RF Code M250 reader and R150 tags. The proposed results illustrate the noise factor of metal material influence RFID system and provide the useful alert when RFID technology is applied in the metal environment of industry engineering.

KeywordAntenna Electromagnetic Simulation Metal Effect Rfid
DOI10.1109/IEEM.2013.6962424
URLView the original
Indexed ByCPCI-S
Language英語English
WOS Research AreaEngineering ; Operations Research & Management Science
WOS SubjectEngineering, Industrial ; Operations Research & Management Science
WOS IDWOS:000395631500062
Scopus ID2-s2.0-84914133416
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Citation statistics
Document TypeConference paper
CollectionDEPARTMENT OF ELECTROMECHANICAL ENGINEERING
Faculty of Science and Technology
AffiliationUniversidade de Macau
First Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Wong S.F.,Zheng Y.. The effect of metal noise factor to RFID location system[C], 2014, 310-314.
APA Wong S.F.., & Zheng Y. (2014). The effect of metal noise factor to RFID location system. IEEE International Conference on Industrial Engineering and Engineering Management, 310-314.
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