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Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy
Lu S.G.2; Chen H.2; Mak C.L.1; Wong K.H.1; Chan H.L.W.1; Choy C.L.1; Xu J.J.1; Shi S.Q.1
2005-12-01
Source PublicationKey Engineering Materials
Volume280-283
IssueII
Pages1903-1908
AbstractEpitaxially graded barium strontium titanate (BaSr )TiO (x = 0.75,0.8,0.9,1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (LaSr)MnO (LSMO)/LaAlO (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric - paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.
KeywordBarium strontium titanate Scanning force microscopy Thin film
URLView the original
Language英語English
Fulltext Access
Document TypeConference paper
CollectionUniversity of Macau
Affiliation1.Hong Kong Polytechnic University
2.City University of Hong Kong
Recommended Citation
GB/T 7714
Lu S.G.,Chen H.,Mak C.L.,et al. Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy[C], 2005, 1903-1908.
APA Lu S.G.., Chen H.., Mak C.L.., Wong K.H.., Chan H.L.W.., Choy C.L.., Xu J.J.., & Shi S.Q. (2005). Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy. Key Engineering Materials, 280-283(II), 1903-1908.
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