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Measurement uncertainty of nano bionix universal testing system
Wu C.-L.2; Pan F.-L.1; Tuan C.-F.1; Chen S.-J.1; Fang W.2; Yip M.-C.2
2008-12-01
Source PublicationSensors and Materials
ISSN09144935
Volume20Issue:7Pages:351-363
AbstractThe main purpose of this research is to determine the uncertainties of force and displacement measurements for MTS Nano Bionix Universal Testing System (UTM). This article can be used as basis for calculating measurement uncertainty in performing material tests. Standard weights are used to calibrate the force of the testing system. In addition, an optical method is adopted to evaluate the displacement uncertainty of the system. We adopted the method suggested in ISO to calculate the uncertainty of this system. The relative expanded uncertainty of force measurement within the range of 10 to 200 mN is 2.07× 10 with a 95% confidence level. The expanded uncertainty of displacement measurement within the range of 0 to 88 mm is 1.4×10 m with a 95% confidence level.
KeywordDisplacement measurement Force Uncertainty
URLView the original
Language英語English
Fulltext Access
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.Industrial Technology Research Institute of Taiwan
2.National Tsing Hua University
Recommended Citation
GB/T 7714
Wu C.-L.,Pan F.-L.,Tuan C.-F.,et al. Measurement uncertainty of nano bionix universal testing system[J]. Sensors and Materials, 2008, 20(7), 351-363.
APA Wu C.-L.., Pan F.-L.., Tuan C.-F.., Chen S.-J.., Fang W.., & Yip M.-C. (2008). Measurement uncertainty of nano bionix universal testing system. Sensors and Materials, 20(7), 351-363.
MLA Wu C.-L.,et al."Measurement uncertainty of nano bionix universal testing system".Sensors and Materials 20.7(2008):351-363.
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