Residential College | false |
Status | 已發表Published |
Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method | |
Zhou,Yongzhi1; Wu,Hao1; Lou,Boliang2; Deng,Hui2; Song,Yonghua1,3; Hua,Wen2; Shen,Yijun2 | |
2019-03-16 | |
Source Publication | Electric Power Components and Systems |
ISSN | 1532-5008 |
Volume | 47Issue:4-5Pages:345-356 |
Abstract | A novel method is proposed to calculate the area of vulnerability (AOV) to voltage sags, which can reflect the relationship between the position of fault occurrence and voltage sags at sensitive buses. Previous methods based on interpolation approach are mainly based on the assumption that the fault voltage magnitude curve has a unimodal shape, which does not hold in all cases. Moreover, the accuracy of polynomial interpolation is largely affected by the selection strategy of sample points, and inappropriate initial points will lead to divergence. To overcome these drawbacks, an effective approach which does not rely on sample results is proposed, where the fault voltage magnitude curve could be any arbitrary shapes. The AOV is derived by solving the parametric fault voltage equations, where Galerkin method is used to identify the polynomial approximation coefficients. With the order of polynomial approximation increased, an iteration scheme is applied, where the results in each iteration are selected as the initial points of the next iteration. Case studies show that the proposed method can provide very accurate results with high efficiency. |
Keyword | Area Of Vulnerability Galerkin Method Polynomial Approximation Voltage Sags |
DOI | 10.1080/15325008.2019.1601297 |
URL | View the original |
Indexed By | SCIE |
Language | 英語English |
WOS Research Area | Engineering |
WOS Subject | Engineering, Electrical & Electronic |
WOS ID | WOS:000489682400004 |
Scopus ID | 2-s2.0-85068575924 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | Faculty of Science and Technology |
Corresponding Author | Wu,Hao |
Affiliation | 1.College of Electrical Engineering,Zhejiang University,Hangzhou,China 2.State Grid Zhejiang Electric Power Research Institute,Hangzhou,China 3.Department of Electrical and Computer Engineering,University of Macau,Taipa,Macao |
Recommended Citation GB/T 7714 | Zhou,Yongzhi,Wu,Hao,Lou,Boliang,et al. Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method[J]. Electric Power Components and Systems, 2019, 47(4-5), 345-356. |
APA | Zhou,Yongzhi., Wu,Hao., Lou,Boliang., Deng,Hui., Song,Yonghua., Hua,Wen., & Shen,Yijun (2019). Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method. Electric Power Components and Systems, 47(4-5), 345-356. |
MLA | Zhou,Yongzhi,et al."Identification of the Area of Vulnerability to Voltage Sags Based on Galerkin Method".Electric Power Components and Systems 47.4-5(2019):345-356. |
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