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A 0.003-mm2 440fsRMS-Jitter and-64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS
Yang,Zunsong1; Chen,Yong1; Mak,Pui In1; Martins,Rui P.1,2
2020-04
Conference Name2019 IEEE Asian Solid-State Circuits Conference (A-SSCC)
Source PublicationProceedings - 2019 IEEE Asian Solid-State Circuits Conference, A-SSCC 2019
Pages283-284
Conference Date4-6 Nov. 2019
Conference PlaceMacau
Abstract

This paper reports a current-reuse sampling phase detector for a type-I phase-locked loop (PLL) to simultaneously achieve both wide loop bandwidth and low control voltage ripple, resulting in low RMS jitter and reference spur, while minimizing the chip area by avoiding an explicit loop filter. Fabricated in 28-nm CMOS, the PLL prototype measures a jitter of 440 fs, and a spur level of-64 dBc at 3.296 GHz. The die area is 0.003 mm.

KeywordPhase Detector Phase Locked Loop (Pll) Reference Spur Ring Voltage-controlled Oscillator (Vco) Rms Jitter
DOI10.1109/A-SSCC47793.2019.9056944
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000655248200003
Scopus ID2-s2.0-85083668780
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Citation statistics
Document TypeConference paper
CollectionTHE STATE KEY LABORATORY OF ANALOG AND MIXED-SIGNAL VLSI (UNIVERSITY OF MACAU)
Faculty of Science and Technology
INSTITUTE OF MICROELECTRONICS
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Affiliation1.State Key Laboratory of Analog and Mixed-Signal VLSI,IME,FST-ECE,University of Macau,Macao
2.Instituto Superior Técnico,Universidade de Lisboa,Portugal
First Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Yang,Zunsong,Chen,Yong,Mak,Pui In,et al. A 0.003-mm2 440fsRMS-Jitter and-64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS[C], 2020, 283-284.
APA Yang,Zunsong., Chen,Yong., Mak,Pui In., & Martins,Rui P. (2020). A 0.003-mm2 440fsRMS-Jitter and-64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS. Proceedings - 2019 IEEE Asian Solid-State Circuits Conference, A-SSCC 2019, 283-284.
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