Residential College | false |
Status | 已發表Published |
Digital Battery Management Unit with Built-In Resistance Compensation and Accidental Mutation Protection for Fast and Accurate Charging | |
Alternative Title | [Best Paper Award] |
Li,Ji Xuan1; Sin,Sai Weng1; Chio,U. Fat1; Wu,Ya Jie1; Lam,Chi Seng1; Martins,Rui Paulo2 | |
2019-11-01 | |
Conference Name | 2019 IEEE International Conference on Integrated Circuits, Technologies and Applications |
Source Publication | 2019 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2019 - Proceedings |
Pages | 49-50 |
Conference Date | Nov. 13 – Nov. 15, 2019 |
Conference Place | Chengdu |
Country | China |
Abstract | This paper proposes a digital battery management unit (BMU) with built-in resistance (BIR) compensation and accidental mutation protection (AMP) techniques to achieve fast and accurate charging, which applied in LDO-based charger. The digital compensation dynamically estimates the BIR. The battery can get fully charged with large rated charging current in pulsed constant current (PCC) mode and effectively reduced the charging time. AMP calibrates the mutate messages automatically to deal with some unexpected situations and guarantee the steady operation for the compensation module. The BMU is fabricated in 28 nm CMOS, occupies 0.014 mm of silicon area. Experimental results show that 73.3% charging time is reduced with 1.5A charging current. The power consumption of the digital chip is 59.1 μW. |
Keyword | Accidental Mutation Protection (Amp) Built-in Resistance (Bir) Constant Current (Cc) Constant-voltage (Cv) Fast Charging |
DOI | 10.1109/ICTA48799.2019.9012837 |
URL | View the original |
Indexed By | CPCI-S ; EI |
Language | 英語English |
WOS Research Area | Engineering |
WOS Subject | Engineering, Electrical & Electronic |
WOS ID | WOS:000569524500034 |
Scopus ID | 2-s2.0-85081982635 |
Fulltext Access | |
Citation statistics | |
Document Type | Conference paper |
Collection | INSTITUTE OF MICROELECTRONICS |
Corresponding Author | Sin,Sai Weng |
Affiliation | 1.University of Macau 2.Instituto Superior Técnico/Universidade de Lisboa,Lisbon,Portugal |
First Author Affilication | University of Macau |
Corresponding Author Affilication | University of Macau |
Recommended Citation GB/T 7714 | Li,Ji Xuan,Sin,Sai Weng,Chio,U. Fat,et al. Digital Battery Management Unit with Built-In Resistance Compensation and Accidental Mutation Protection for Fast and Accurate Charging[C], 2019, 49-50. |
APA | Li,Ji Xuan., Sin,Sai Weng., Chio,U. Fat., Wu,Ya Jie., Lam,Chi Seng., & Martins,Rui Paulo (2019). Digital Battery Management Unit with Built-In Resistance Compensation and Accidental Mutation Protection for Fast and Accurate Charging. 2019 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2019 - Proceedings, 49-50. |
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