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Optimizing the parameters for patch-based texture synthesis
Wang, Yiping1; Wang, Wencheng2; Wu, Enhua3
2006
Conference NameACM International Conference on Virtual Reality Continuum and its Applications, VRCIA 2006
Source PublicationProceedings - VRCIA 2006: ACM International Conference on Virtual Reality Continuum and its Applications
Pages75-82
Conference Date6 14, 2006 - 6 17, 2006
Conference PlaceHong Kong, China
Author of SourceAssociation for Computing Machinery (ACM)
Abstract

Patch-based texture synthesis takes patches of sample textures to produce new textures, and has the fame to run fast and produce textures very efficiently. In its operation, its parameters for synthesis, including the shape and size of patches and the widths of the overlapping regions between adjacent patches, have much impact on its synthesis efficiency. However, less discussion can be found on these impacts. This paper presents novel methods to measure the impacts by these parameters, and then adaptively optimize these parameters to promote patch-based texture synthesis. © 2006 ACM.

DOI10.1145/1128923.1128936
Language英語English
Scopus ID2-s2.0-33748125127
Fulltext Access
Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
Affiliation1.University of Science and Technology of China, China;
2.Institute of Software, Chinese Academy of Sciences, China;
3.University of Macau, China
Recommended Citation
GB/T 7714
Wang, Yiping,Wang, Wencheng,Wu, Enhua. Optimizing the parameters for patch-based texture synthesis[C]. Association for Computing Machinery (ACM), 2006, 75-82.
APA Wang, Yiping., Wang, Wencheng., & Wu, Enhua (2006). Optimizing the parameters for patch-based texture synthesis. Proceedings - VRCIA 2006: ACM International Conference on Virtual Reality Continuum and its Applications, 75-82.
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