A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS

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	A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS
	Yang, Z.; Chen, Y.; Mak, P. I.; Martins, R. P.
	2021-03-17
Source Publication	IEEE Transactions on Circuits and Systems I: Regular Papers
ISSN	xxxx
Pages	2307 -2316
Abstract	This paper presents a linear current-reuse sampling phase detector for a single-loop type-I phase-locked loop (PLL) to simultaneously achieve a wide loop bandwidth and low control voltage ripple, resulting in low RMS jitter and reference spur, while minimizing the chip area by avoiding an explicit loop filter. Fabricated in 28-nm CMOS, the PLL prototype measures an integrated jitter of 440 fs RMS , and a spur level of −63.9 dBc at 3.296 GHz. It draws 3.3 mW at a 0.9-V supply and scores a jitter-power figure-of-merit (FoM) of −241.9 dB. With a 103-MHz reference input, a bandwidth of ~20 MHz aids suppressing significantly the ring VCO’s phase noise (PN), leading to an in-band PN of −116 dBc/Hz at 1-MHz offset. The die size is 0.003 mm 2 .
Keyword	CMOS PLL Jitter
URL	View the original
Language	英語English
The Source to Article	PB_Publication
PUB ID	59551
Document Type	Journal article
Collection	INSTITUTE OF MICROELECTRONICS
Corresponding Author	Chen, Y.
Recommended Citation GB/T 7714	Yang, Z.,Chen, Y.,Mak, P. I.,et al. A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS[J]. IEEE Transactions on Circuits and Systems I: Regular Papers, 2021, 2307 -2316.
APA	Yang, Z.., Chen, Y.., Mak, P. I.., & Martins, R. P. (2021). A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS. IEEE Transactions on Circuits and Systems I: Regular Papers, 2307 -2316.
MLA	Yang, Z.,et al."A 0.003-mm2 440fsRMS-Jitter and −64dBc-Reference-Spur Ring-VCO-Based Type-I PLL Using a Current-Reuse Sampling Phase Detector in 28-nm CMOS".IEEE Transactions on Circuits and Systems I: Regular Papers (2021):2307 -2316.

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