Residential College | false |
Status | 已發表Published |
Impersonal probability assessment of equipment trip probability due to voltage sag | |
Wang Y.; Huang Y.; Ma C.; Xiao X. | |
2010-06-03 | |
Conference Name | Asia-Pacific Power and Energy Engineering Conference, APPEEC |
Source Publication | Asia-Pacific Power and Energy Engineering Conference, APPEEC |
Conference Date | MAR 28-31, 2010 |
Conference Place | Chengdu, PEOPLES R CHINA |
Abstract | The assessment of equipment trip probability due to voltage sag is a complicated matter because of the uncertainties both from voltage sag in power systems and sensitive equipment in customer side. The uncertainties of influencing factors are difficult to determine especially the stochastic distribution of voltage tolerance of equipment. The characteristics of voltage sag are determined by sag severity indices and the probability density function of voltage tolerance of equipment is determined by maximum entropy model. An impersonal assessment method is proposed in this paper. As a case study, PC is simulated and the simulation results are compared with the current methods. ©2010 IEEE. |
Keyword | Impersonal Evaluation Maximum Entropy Model Sensitive Equipment Trip Probability Voltage Sag |
DOI | 10.1109/APPEEC.2010.5448535 |
URL | View the original |
Language | 英語English |
WOS ID | WOS:000396400801181 |
Scopus ID | 2-s2.0-84869994445 |
Fulltext Access | |
Citation statistics | |
Document Type | Conference paper |
Collection | University of Macau |
Affiliation | Sichuan University |
Recommended Citation GB/T 7714 | Wang Y.,Huang Y.,Ma C.,et al. Impersonal probability assessment of equipment trip probability due to voltage sag[C], 2010. |
APA | Wang Y.., Huang Y.., Ma C.., & Xiao X. (2010). Impersonal probability assessment of equipment trip probability due to voltage sag. Asia-Pacific Power and Energy Engineering Conference, APPEEC. |
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