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Impersonal probability assessment of equipment trip probability due to voltage sag
Wang Y.; Huang Y.; Ma C.; Xiao X.
2010-06-03
Conference NameAsia-Pacific Power and Energy Engineering Conference, APPEEC
Source PublicationAsia-Pacific Power and Energy Engineering Conference, APPEEC
Conference DateMAR 28-31, 2010
Conference PlaceChengdu, PEOPLES R CHINA
Abstract

The assessment of equipment trip probability due to voltage sag is a complicated matter because of the uncertainties both from voltage sag in power systems and sensitive equipment in customer side. The uncertainties of influencing factors are difficult to determine especially the stochastic distribution of voltage tolerance of equipment. The characteristics of voltage sag are determined by sag severity indices and the probability density function of voltage tolerance of equipment is determined by maximum entropy model. An impersonal assessment method is proposed in this paper. As a case study, PC is simulated and the simulation results are compared with the current methods. ©2010 IEEE.

KeywordImpersonal Evaluation Maximum Entropy Model Sensitive Equipment Trip Probability Voltage Sag
DOI10.1109/APPEEC.2010.5448535
URLView the original
Language英語English
WOS IDWOS:000396400801181
Scopus ID2-s2.0-84869994445
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Citation statistics
Document TypeConference paper
CollectionUniversity of Macau
AffiliationSichuan University
Recommended Citation
GB/T 7714
Wang Y.,Huang Y.,Ma C.,et al. Impersonal probability assessment of equipment trip probability due to voltage sag[C], 2010.
APA Wang Y.., Huang Y.., Ma C.., & Xiao X. (2010). Impersonal probability assessment of equipment trip probability due to voltage sag. Asia-Pacific Power and Energy Engineering Conference, APPEEC.
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