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Measurement models for survivability and competitiveness of very large E-marketplace Journal article
Jingzhi Guo, Chengzheng Sun. Measurement models for survivability and competitiveness of very large E-marketplace[J]. COMPUTATIONAL SCIENCE - ICCS 2003, PT II, PROCEEDINGS, 2003, 2658, 802-811.
Authors:  Jingzhi Guo;  Chengzheng Sun
Favorite | TC[WOS]:2 TC[Scopus]:3 | Submit date：2019/02/13