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Measurement uncertainty of nano bionix universal testing system Journal article
Wu C.-L., Pan F.-L., Tuan C.-F., Chen S.-J., Fang W., Yip M.-C.. Measurement uncertainty of nano bionix universal testing system[J]. Sensors and Materials, 2008, 20(7), 351-363.
Authors:  Wu C.-L.;  Pan F.-L.;  Tuan C.-F.;  Chen S.-J.;  Fang W.; et al.
Favorite |  | Submit date：2019/04/08
Displacement measurement  Force  Uncertainty