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2024 [1]
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Exploring the Performance of Hall Sensor with Substrate Bias Modulation in SOI Process
Journal article
Cao, Boyang, Lei, Ka Meng, Zou, Hengchen, Martins, Rui P., Mak, Pui In. Exploring the Performance of Hall Sensor with Substrate Bias Modulation in SOI Process[J]. IEEE Sensors Journal, 2024, 24(17), 27365-27372.
Authors:
Cao, Boyang
;
Lei, Ka Meng
;
Zou, Hengchen
;
Martins, Rui P.
;
Mak, Pui In
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TC[WOS]:
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IF:
4.3
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4.2
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Submit date：2024/08/05
Cmos
Cross Plate
Horizontal Hall Sensor
Substrate-biased
