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Faculty of Scien... [1]
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PUN CHI MAN [1]
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Journal article [1]
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2020 [1]
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英語English [1]
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NEUROCOMPUTING [1]
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SCIE [1]
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Locating splicing forgery by adaptive-SVD noise estimation and vicinity noise descriptor
Journal article
Liu,Bo, Pun,Chi Man. Locating splicing forgery by adaptive-SVD noise estimation and vicinity noise descriptor[J]. NEUROCOMPUTING, 2020, 387, 172-187.
Authors:
Liu,Bo
;
Pun,Chi Man
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TC[WOS]:
15
TC[Scopus]:
18
IF:
5.5
/
5.5
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Submit date：2021/03/11
Noise Estimation
Adaptive Svd
Splicing Forgery
Image Forensics
