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Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods Journal article
Lei, Soichan, Huang, Jia-Hong, Chen, Haydn. Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods[J]. MATERIALS CHEMISTRY AND PHYSICS, 2017, 199, 185-192.
Authors:  Lei, Soichan;  Huang, Jia-Hong;  Chen, Haydn
Favorite | TC[WOS]:15 TC[Scopus]:16  IF:4.3/4.1 | Submit date：2018/10/30
Ti Interlayer  Tin  Residual Stress  Average X-ray Strain  Synchrotron X-ray  
Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method Journal article
Wang A.-N., Huang J.-H., Hsiao H.-W., Yu G.-P., Chen H.. Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method[J]. Surface and Coatings Technology, 2015, 280, 43-49.
Authors:  Wang A.-N.;  Huang J.-H.;  Hsiao H.-W.;  Yu G.-P.;  Chen H.
Favorite | TC[WOS]:28 TC[Scopus]:29 | Submit date：2019/04/08
Average X-ray Strain (Axs)  Cos2αsin2ψ Method  Nanoindentation  Residual Stress  Tin Thin Film