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Investigating the Reliability of a Negative Capacitance Field Effect Transistor Regarding the Electric Field Across the Oxide Layer Journal article
Liu, Bingtao, Sun, Hanxi, Huan, Changmeng, Jia, Renxu, Cai, Yongqing, Ke, Qingqing. Investigating the Reliability of a Negative Capacitance Field Effect Transistor Regarding the Electric Field Across the Oxide Layer[J]. Journal of Electronic Materials, 2023, 52, 3180-3187.
Authors:  Liu, Bingtao;  Sun, Hanxi;  Huan, Changmeng;  Jia, Renxu;  Cai, Yongqing; et al.
Favorite | TC[WOS]:2 TC[Scopus]:2  IF:2.2/1.9 | Submit date：2023/06/07
Electric Field Distribution  Negative Capacitance  Oxide Reliability  Tcad  
Simulation for Transient Moisture Distribution and Effects on the Electric Field in Stable Condition: 110 kV Oil-Immersed Insulation Paper Bushing Journal article
Wang,Dongyang, Zhou,Lijun, Yang,Zhixin, Liao,Wei, Wang,Lujia, Guo,Lei. Simulation for Transient Moisture Distribution and Effects on the Electric Field in Stable Condition: 110 kV Oil-Immersed Insulation Paper Bushing[J]. IEEE Access, 2019, 7, 162991-163002.
Authors:  Wang,Dongyang;  Zhou,Lijun;  Yang,Zhixin;  Liao,Wei;  Wang,Lujia; et al.
Favorite | TC[WOS]:10 TC[Scopus]:11  IF:3.4/3.7 | Submit date：2021/03/11
110 Kv  Capacitor Core  Electric Field  Oil-immersed Insulation Paper (Oip) Bushing  Transient Moisture Distribution