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Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes Journal article
Ho, Sut Kam, Garcia, Dario Machado. Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes[J]. APPLIED SPECTROSCOPY, 2017, 71(4), 735-743.
Authors:  Ho, Sut Kam;  Garcia, Dario Machado
Favorite | TC[WOS]:3 TC[Scopus]:3  IF:2.2/2.9 | Submit date：2018/10/30
Indium Tin Oxide  Ito  Ito Film  Laser-excited Atomic Fluorescence  Leaf  Destructiveness  Thin-film Analysis  
Multi-element analysis by ArF laser excited atomic fluorescence of laser ablated plumes: Mechanism and applications Journal article
Yue Cai, Po-Chun Chu, Sut Kam Ho, Nai-Ho Cheung. Multi-element analysis by ArF laser excited atomic fluorescence of laser ablated plumes: Mechanism and applications[J]. Frontiers of Physics, 2012, 7(6), 670-678.
Authors:  Yue Cai;  Po-Chun Chu;  Sut Kam Ho;  Nai-Ho Cheung
Favorite | TC[WOS]:26 TC[Scopus]:26  IF:1.9/2.5 | Submit date：2019/03/14
Laser-excited Atomic Fluorescence (Leaf)  Argon Fluoride Laser  Laser Plume Spectroscopy  Multi-element Analysis