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Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area Journal article
Wang, Guan Cheng, Zhu, Yan, Chan, Chi-Hang, Seng-Pan, U., Martins, Rui P.. Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018, 26(11), 2279-2289.
Authors:  Wang, Guan Cheng;  Zhu, Yan;  Chan, Chi-Hang;  Seng-Pan, U.;  Martins, Rui P.
Favorite | TC[WOS]:3 TC[Scopus]:3  IF:2.8/2.8 | Submit date：2019/01/17
Bridge Digital-to-analog Converter (Dac)  Gain Error Calibration  Successive Approximation Register (Sar)  Analog-to-digital Converters (Adcs)  Testing Signal Generation (Tsg)