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Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods Journal article
Lei, Soichan, Huang, Jia-Hong, Chen, Haydn. Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods[J]. MATERIALS CHEMISTRY AND PHYSICS, 2017, 199, 185-192.
Authors:  Lei, Soichan;  Huang, Jia-Hong;  Chen, Haydn
Favorite | TC[WOS]:15 TC[Scopus]:16  IF:4.3/4.1 | Submit date：2018/10/30
Ti Interlayer  Tin  Residual Stress  Average X-ray Strain  Synchrotron X-ray  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films deposited by unbalanced magnetron sputtering Journal article
Huang J.-H., Ma C.-H., Chen H.. Effect of Ti interlayer on the residual stress and texture development of TiN thin films deposited by unbalanced magnetron sputtering[J]. Surface and Coatings Technology, 2006, 201(6), 3199-3204.
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
Favorite | TC[WOS]:31 TC[Scopus]:38 | Submit date：2019/04/08
Residual Stress  Texture  Ti Interlayer  Tin  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films Journal article
Huang J.-H., Ma C.-H., Chen H.. Effect of Ti interlayer on the residual stress and texture development of TiN thin films[J]. Surface and Coatings Technology, 2006, 200(20-21), 5937-5945.
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
Favorite | TC[WOS]:48 TC[Scopus]:50 | Submit date：2019/04/08
Residual Stress  Texture  Ti Interlayer  Titanium Nitride