Residential College | false |
Status | 已發表Published |
A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns | |
Chi-Man Vong1; Wong, Pak Kin2; Weng-Fai Ip3 | |
2013-08 | |
Source Publication | IEEE Transactions on Industrial Electronics |
ISSN | 0278-0046 |
Volume | 60Issue:8Pages:3372-3385 |
Abstract | Simultaneous-fault diagnosis is a common problem in many applications and well-studied for time-independent patterns. However, most practical applications are of the type of time-dependent patterns. In our study of simultaneous-fault diagnosis for time-dependent patterns, two key issues are identified: 1) the features of the multiple single faults are mixed or combined into one pattern which makes accurate diagnosis difficult, 2) the acquisition of a large sample data set of simultaneous faults is costly because of high number of combinations of single faults, resulting in many possible classes of simultaneous-fault training patterns. Under the assumption that the time-frequency features of a simultaneous fault are similar to that of its constituent single faults, these issues can be effectively resolved using our proposed framework combining feature extraction, pairwise probabilistic multi-label classification, and decision threshold optimization. This framework has been applied and verified in automotive engine-ignition system diagnosis based on time-dependent ignition patterns as a test case. Experimental results show that the proposed framework can successfully resolve the issues. |
Keyword | Automotive Applications Fault Diagnosis Feature Extraction Genetic Algorithms (Ga) Ignition Internal Combustion Engines Multiple Signal Classification Principal Component Analysis (Pca) Wavelet Packets |
DOI | 10.1109/TIE.2012.2202358 |
URL | View the original |
Indexed By | SCIE |
Language | 英語English |
WOS Research Area | Automation & Control Systems ; Engineering ; Instruments & Instrumentation |
WOS Subject | Automation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation |
WOS ID | WOS:000317864400042 |
Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 |
The Source to Article | Scopus |
Scopus ID | 2-s2.0-84876277688 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | Faculty of Science and Technology DEPARTMENT OF ELECTROMECHANICAL ENGINEERING DEPARTMENT OF COMPUTER AND INFORMATION SCIENCE |
Corresponding Author | Chi-Man Vong |
Affiliation | 1.Department of Computer and Information Science, Faculty of Science and Technology, University of Macau, Taipa, Macao, China 2.Department of Electromechanical Engineering, Faculty of Science and Technology, University of Macau, Taipa, Macao, China 3.Faculty of Science and Technology, University of Macau, Taipa, Macao, China |
First Author Affilication | Faculty of Science and Technology |
Corresponding Author Affilication | Faculty of Science and Technology |
Recommended Citation GB/T 7714 | Chi-Man Vong,Wong, Pak Kin,Weng-Fai Ip. A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns[J]. IEEE Transactions on Industrial Electronics, 2013, 60(8), 3372-3385. |
APA | Chi-Man Vong., Wong, Pak Kin., & Weng-Fai Ip (2013). A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns. IEEE Transactions on Industrial Electronics, 60(8), 3372-3385. |
MLA | Chi-Man Vong,et al."A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns".IEEE Transactions on Industrial Electronics 60.8(2013):3372-3385. |
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