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A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns
Chi-Man Vong1; Wong, Pak Kin2; Weng-Fai Ip3
2013-08
Source PublicationIEEE Transactions on Industrial Electronics
ISSN0278-0046
Volume60Issue:8Pages:3372-3385
Abstract

Simultaneous-fault diagnosis is a common problem in many applications and well-studied for time-independent patterns. However, most practical applications are of the type of time-dependent patterns. In our study of simultaneous-fault diagnosis for time-dependent patterns, two key issues are identified: 1) the features of the multiple single faults are mixed or combined into one pattern which makes accurate diagnosis difficult, 2) the acquisition of a large sample data set of simultaneous faults is costly because of high number of combinations of single faults, resulting in many possible classes of simultaneous-fault training patterns. Under the assumption that the time-frequency features of a simultaneous fault are similar to that of its constituent single faults, these issues can be effectively resolved using our proposed framework combining feature extraction, pairwise probabilistic multi-label classification, and decision threshold optimization. This framework has been applied and verified in automotive engine-ignition system diagnosis based on time-dependent ignition patterns as a test case. Experimental results show that the proposed framework can successfully resolve the issues.

KeywordAutomotive Applications Fault Diagnosis Feature Extraction Genetic Algorithms (Ga) Ignition Internal Combustion Engines Multiple Signal Classification Principal Component Analysis (Pca) Wavelet Packets
DOI10.1109/TIE.2012.2202358
URLView the original
Indexed BySCIE
Language英語English
WOS Research AreaAutomation & Control Systems ; Engineering ; Instruments & Instrumentation
WOS SubjectAutomation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation
WOS IDWOS:000317864400042
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141
The Source to ArticleScopus
Scopus ID2-s2.0-84876277688
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionFaculty of Science and Technology
DEPARTMENT OF ELECTROMECHANICAL ENGINEERING
DEPARTMENT OF COMPUTER AND INFORMATION SCIENCE
Corresponding AuthorChi-Man Vong
Affiliation1.Department of Computer and Information Science, Faculty of Science and Technology, University of Macau, Taipa, Macao, China
2.Department of Electromechanical Engineering, Faculty of Science and Technology, University of Macau, Taipa, Macao, China
3.Faculty of Science and Technology, University of Macau, Taipa, Macao, China
First Author AffilicationFaculty of Science and Technology
Corresponding Author AffilicationFaculty of Science and Technology
Recommended Citation
GB/T 7714
Chi-Man Vong,Wong, Pak Kin,Weng-Fai Ip. A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns[J]. IEEE Transactions on Industrial Electronics, 2013, 60(8), 3372-3385.
APA Chi-Man Vong., Wong, Pak Kin., & Weng-Fai Ip (2013). A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns. IEEE Transactions on Industrial Electronics, 60(8), 3372-3385.
MLA Chi-Man Vong,et al."A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns".IEEE Transactions on Industrial Electronics 60.8(2013):3372-3385.
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