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INSTITUTE OF MIC... [1]
Authors
SIN SAI WENG [1]
LAM CHI SENG [1]
Document Type
Conference paper [1]
Date Issued
2019 [1]
Language
英語English [1]
Source Publication
2019 IEEE Intern... [1]
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CPCI-S [1]
EI [1]
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Digital Battery Management Unit with Built-In Resistance Compensation and Accidental Mutation Protection for Fast and Accurate Charging
Conference paper
Li,Ji Xuan, Sin,Sai Weng, Chio,U. Fat, Wu,Ya Jie, Lam,Chi Seng, Martins,Rui Paulo. Digital Battery Management Unit with Built-In Resistance Compensation and Accidental Mutation Protection for Fast and Accurate Charging[C], 2019, 49-50.
Authors:
Li,Ji Xuan
;
Sin,Sai Weng
;
Chio,U. Fat
;
Wu,Ya Jie
;
Lam,Chi Seng
; et al.
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TC[WOS]:
7
TC[Scopus]:
2
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Submit date：2021/03/09
Accidental Mutation Protection (Amp)
Built-in Resistance (Bir)
Constant Current (Cc)
Constant-voltage (Cv)
Fast Charging
