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2010 [1]
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Impersonal probability assessment of equipment trip probability due to voltage sag
Conference paper
Wang Y., Huang Y., Ma C., Xiao X.. Impersonal probability assessment of equipment trip probability due to voltage sag[C], 2010.
Authors:
Wang Y.
;
Huang Y.
;
Ma C.
;
Xiao X.
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Submit date：2019/01/16
Impersonal Evaluation
Maximum Entropy Model
Sensitive Equipment
Trip Probability
Voltage Sag
