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Faculty of Scien... [1]
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WONG PAK KIN [1]
VONG CHI MAN [1]
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Journal article [1]
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2013 [1]
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英語English [1]
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A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns
Journal article
Chi-Man Vong, Wong, Pak Kin, Weng-Fai Ip. A new framework of simultaneous-fault diagnosis using pairwise probabilistic multi-label classification for time-dependent patterns[J]. IEEE Transactions on Industrial Electronics, 2013, 60(8), 3372-3385.
Authors:
Chi-Man Vong
;
Wong, Pak Kin
;
Weng-Fai Ip
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TC[WOS]:
61
TC[Scopus]:
69
IF:
7.5
/
8.0
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Submit date：2018/10/30
Automotive Applications
Fault Diagnosis
Feature Extraction
Genetic Algorithms (Ga)
Ignition
Internal Combustion Engines
Multiple Signal Classification
Principal Component Analysis (Pca)
Wavelet Packets
