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X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Chung K.S., Hong Hawoong, Aburano R.D., Roesler J.M., Chiang T.C., Chen Haydn. X-ray truncation rods analysis of Cu thin films on C-plane sapphire[J]. Materials Research Society Symposium Proceedings, 1996, 437, 21-26.
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.; et al.
Favorite |  | Submit date：2019/04/08
X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Chung K.S., Hong Hawoong, Aburano R.D., Roesler J.M., Chiang T.C., Chen Haydn. X-ray truncation rods analysis of Cu thin films on C-plane sapphire[J]. Materials Research Society Symposium Proceedings, 1996, 437, 21-26.
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.; et al.
Favorite |  | Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.; et al.
Favorite | TC[WOS]:33 TC[Scopus]:39 | Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.; et al.
Favorite | TC[WOS]:33 TC[Scopus]:39 | Submit date：2019/04/08