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Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO 3-buffered silicon substrates by sol-gel processing Journal article
Zhai J., Shen B., Yao X., Xu Z., Li X., Chen H.. Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO 3-buffered silicon substrates by sol-gel processing[J]. Journal of Sol-Gel Science and Technology, 2007, 42(3), 369-373.
Authors:  Zhai J.;  Shen B.;  Yao X.;  Xu Z.;  Li X.; et al.
Favorite | TC[WOS]:10 TC[Scopus]:11 | Submit date：2019/04/08
Antiferroelectric  Electrical Property  Phase Transformation  Sol-gel Process  Thin Film  
Effect of the orientation on the ferroelectric-antiferroelectric behavior of sol-gel deposited (Pb,Nb)(Zr,Sn,Ti)O3 thin films Journal article
Zhai J., Li X., Chen H.. Effect of the orientation on the ferroelectric-antiferroelectric behavior of sol-gel deposited (Pb,Nb)(Zr,Sn,Ti)O3 thin films[J]. Thin Solid Films, 2004, 446(2), 200-204.
Authors:  Zhai J.;  Li X.;  Chen H.
Favorite | TC[WOS]:21 TC[Scopus]:21 | Submit date：2019/04/08
Antiferroelectric Thin Film  Electric Properties (Section a)  Phase Transitions  Structural Properties  
Growth and characterization of PNZST thin films Conference paper
Zhai J., Li X., Yao Y., Chen H.. Growth and characterization of PNZST thin films[C], 2003, 230-233.
Authors:  Zhai J.;  Li X.;  Yao Y.;  Chen H.
Favorite | TC[WOS]:12 TC[Scopus]:13 | Submit date：2019/04/08
Antiferroelectric Thin Film  Dielectric Properties  Microstructure  Pnzst  Sol-gel Technique