×
验证码:
换一张
Forgotten Password?
Stay signed in
Login With UMPASS
English
|
繁體
Login With UMPASS
Log In
ALL
ORCID
TI
AU
PY
SU
KW
TY
JN
DA
IN
PB
FP
ST
SM
Study Hall
Image search
Paste the image URL
Home
Faculties & Institutes
Scholars
Publications
Subjects
Statistics
News
Search in the results
Faculties & Institutes
Authors
Document Type
Journal article [12]
Date Issued
1996 [4]
1995 [2]
1993 [2]
1992 [4]
Language
英語English [12]
Source Publication
Physical Review ... [4]
Applied Physics ... [2]
Journal of Appli... [2]
Materials Resear... [2]
Physical Review ... [2]
Indexed By
Funding Organization
Funding Project
×
Knowledge Map
UM
Start a Submission
Submissions
Unclaimed
Claimed
Attach Fulltext
Bookmarks
Browse/Search Results:
1-10 of 12
Help
Selected(
0
)
Clear
Items/Page:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort:
Select
Issue Date Ascending
Issue Date Descending
Submit date Ascending
Submit date Descending
Author Ascending
Author Descending
Journal Impact Factor Ascending
Journal Impact Factor Descending
Title Ascending
Title Descending
WOS Cited Times Ascending
WOS Cited Times Descending
X-ray truncation rods analysis of Cu thin films on C-plane sapphire
Journal article
Chung K.S., Hong Hawoong, Aburano R.D., Roesler J.M., Chiang T.C., Chen Haydn. X-ray truncation rods analysis of Cu thin films on C-plane sapphire[J]. Materials Research Society Symposium Proceedings, 1996, 437, 21-26.
Authors:
Chung K.S.
;
Hong Hawoong
;
Aburano R.D.
;
Roesler J.M.
;
Chiang T.C.
; et al.
Favorite
|
|
Submit date：2019/04/08
X-ray truncation rods analysis of Cu thin films on C-plane sapphire
Journal article
Chung K.S., Hong Hawoong, Aburano R.D., Roesler J.M., Chiang T.C., Chen Haydn. X-ray truncation rods analysis of Cu thin films on C-plane sapphire[J]. Materials Research Society Symposium Proceedings, 1996, 437, 21-26.
Authors:
Chung K.S.
;
Hong Hawoong
;
Aburano R.D.
;
Roesler J.M.
;
Chiang T.C.
; et al.
Favorite
|
|
Submit date：2019/04/08
X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth
Journal article
Hong H., Aburano R.D., Chung K.-S., Lin D.-S., Hirschorn E.S., Chiang T.-C., Chen H.. X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth[J]. Journal of Applied Physics, 1996, 79(9), 6858-6864.
Authors:
Hong H.
;
Aburano R.D.
;
Chung K.-S.
;
Lin D.-S.
;
Hirschorn E.S.
; et al.
Favorite
|
TC[WOS]:
2
TC[Scopus]:
2
|
Submit date：2019/04/08
X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth
Journal article
Hong H., Aburano R.D., Chung K.-S., Lin D.-S., Hirschorn E.S., Chiang T.-C., Chen H.. X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth[J]. Journal of Applied Physics, 1996, 79(9), 6858-6864.
Authors:
Hong H.
;
Aburano R.D.
;
Chung K.-S.
;
Lin D.-S.
;
Hirschorn E.S.
; et al.
Favorite
|
TC[WOS]:
2
TC[Scopus]:
2
|
Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction
Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:
Aburano R.D.
;
Hong H.
;
Roesler J.M.
;
Chung K.
;
Lin D.-S.
; et al.
Favorite
|
TC[WOS]:
33
TC[Scopus]:
39
|
Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction
Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:
Aburano R.D.
;
Hong H.
;
Roesler J.M.
;
Chung K.
;
Lin D.-S.
; et al.
Favorite
|
TC[WOS]:
33
TC[Scopus]:
39
|
Submit date：2019/04/08
Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers
Journal article
Hong H., Aburano R.D., Hirschorn E.S., Zschack P., Chen H., Chiang T.-C.. Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers[J]. Physical Review B, 1993, 47(11), 6450-6454.
Authors:
Hong H.
;
Aburano R.D.
;
Hirschorn E.S.
;
Zschack P.
;
Chen H.
; et al.
Favorite
|
TC[WOS]:
12
TC[Scopus]:
11
|
Submit date：2019/04/08
Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers
Journal article
Hong H., Aburano R.D., Hirschorn E.S., Zschack P., Chen H., Chiang T.-C.. Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers[J]. Physical Review B, 1993, 47(11), 6450-6454.
Authors:
Hong H.
;
Aburano R.D.
;
Hirschorn E.S.
;
Zschack P.
;
Chen H.
; et al.
Favorite
|
TC[WOS]:
12
TC[Scopus]:
11
|
Submit date：2019/04/08
C 60 encapsulation of the Si(111)-(7×7) surface
Journal article
Hong H., McMahon W.E., Zschack P., Lin D.-S., Aburano R.D., Chen H., Chiang T.-C.. C 60 encapsulation of the Si(111)-(7×7) surface[J]. Applied Physics Letters, 1992, 61(26), 3127-3129.
Authors:
Hong H.
;
McMahon W.E.
;
Zschack P.
;
Lin D.-S.
;
Aburano R.D.
; et al.
Favorite
|
TC[WOS]:
34
TC[Scopus]:
30
|
Submit date：2019/04/08
C 60 encapsulation of the Si(111)-(7×7) surface
Journal article
Hong H., McMahon W.E., Zschack P., Lin D.-S., Aburano R.D., Chen H., Chiang T.-C.. C 60 encapsulation of the Si(111)-(7×7) surface[J]. Applied Physics Letters, 1992, 61(26), 3127-3129.
Authors:
Hong H.
;
McMahon W.E.
;
Zschack P.
;
Lin D.-S.
;
Aburano R.D.
; et al.
Favorite
|
TC[WOS]:
34
TC[Scopus]:
30
|
Submit date：2019/04/08
