English | 繁體

Search in the results

UM

Browse/Search Results:  1-10 of 12 Help

Selected(0)Clear Items/Page:    Sort:
Time-resolved reflection surface x-ray diffraction Journal article
Hong H., Wu Z., Chiang T.-C., Zschack P., Chen H.. Time-resolved reflection surface x-ray diffraction[J]. Review of Scientific Instruments, 2002, 73(4).
Authors:  Hong H.;  Wu Z.;  Chiang T.-C.;  Zschack P.;  Chen H.
Favorite | TC[WOS]:8 TC[Scopus]:10 | Submit date：2019/04/08
Determination of phonon dispersions from x-ray transmission scattering: The example of silicon Journal article
Holt M., Wu Z., Hong H., Zschack P., Jemian P., Tischler J., Chen H., Chiang T.-C.. Determination of phonon dispersions from x-ray transmission scattering: The example of silicon[J]. Physical Review Letters, 1999, 83(16), 3317-3319.
Authors:  Holt M.;  Wu Z.;  Hong H.;  Zschack P.;  Jemian P.; et al.
Favorite | TC[WOS]:64 TC[Scopus]:71 | Submit date：2019/04/08
Pattern of x-ray scattering by thermal phonons in si Journal article
Wu Z., Hong H., Aburano R., Zschack P., Jemian P., Tischler J., Chen H., Luh D.-A., Chiang T.-C.. Pattern of x-ray scattering by thermal phonons in si[J]. Physical Review B - Condensed Matter and Materials Physics, 1999, 59(5), 3283-3286.
Authors:  Wu Z.;  Hong H.;  Aburano R.;  Zschack P.;  Jemian P.; et al.
Favorite | TC[WOS]:21 TC[Scopus]:22 | Submit date：2019/04/08
Interfacial structure Journal article
Aburano R., Hong H., Chung K., Nelson M., Zschack P., Chen H., Chiang T.. Interfacial structure[J]. Physical Review B - Condensed Matter and Materials Physics, 1998, 57(11), 6636-6641.
Authors:  Aburano R.;  Hong H.;  Chung K.;  Nelson M.;  Zschack P.; et al.
Favorite | TC[WOS]:5 TC[Scopus]:5 | Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.; et al.
Favorite | TC[WOS]:33 TC[Scopus]:39 | Submit date：2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Aburano R.D., Hong H., Roesler J.M., Chung K., Lin D.-S., Zschack P., Chen H., Chiang T.-C.. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B, 1995, 52(3), 1839-1847.
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.; et al.
Favorite | TC[WOS]:33 TC[Scopus]:39 | Submit date：2019/04/08
Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers Journal article
Hong H., Aburano R.D., Hirschorn E.S., Zschack P., Chen H., Chiang T.-C.. Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers[J]. Physical Review B, 1993, 47(11), 6450-6454.
Authors:  Hong H.;  Aburano R.D.;  Hirschorn E.S.;  Zschack P.;  Chen H.; et al.
Favorite | TC[WOS]:12 TC[Scopus]:11 | Submit date：2019/04/08
Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers Journal article
Hong H., Aburano R.D., Hirschorn E.S., Zschack P., Chen H., Chiang T.-C.. Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers[J]. Physical Review B, 1993, 47(11), 6450-6454.
Authors:  Hong H.;  Aburano R.D.;  Hirschorn E.S.;  Zschack P.;  Chen H.; et al.
Favorite | TC[WOS]:12 TC[Scopus]:11 | Submit date：2019/04/08
C 60 encapsulation of the Si(111)-(7×7) surface Journal article
Hong H., McMahon W.E., Zschack P., Lin D.-S., Aburano R.D., Chen H., Chiang T.-C.. C 60 encapsulation of the Si(111)-(7×7) surface[J]. Applied Physics Letters, 1992, 61(26), 3127-3129.
Authors:  Hong H.;  McMahon W.E.;  Zschack P.;  Lin D.-S.;  Aburano R.D.; et al.
Favorite | TC[WOS]:34 TC[Scopus]:30 | Submit date：2019/04/08
C 60 encapsulation of the Si(111)-(7×7) surface Journal article
Hong H., McMahon W.E., Zschack P., Lin D.-S., Aburano R.D., Chen H., Chiang T.-C.. C 60 encapsulation of the Si(111)-(7×7) surface[J]. Applied Physics Letters, 1992, 61(26), 3127-3129.
Authors:  Hong H.;  McMahon W.E.;  Zschack P.;  Lin D.-S.;  Aburano R.D.; et al.
Favorite | TC[WOS]:34 TC[Scopus]:30 | Submit date：2019/04/08